Scanning Electron Microscope

Jeol JSM 840

Specifications Imaging Modes: SEI / BEI Accel. Voltage: 1-35KV Resolution: 4nm / 10nm Source: W hairpin / LaB6 Ancillary Equipment Digital Image Acquisition System EDX spectrometer (Z>5)

The general purpose JEOL JSM-840 scanning electron microscope is designed to fulfil many diverse needs of microscopy and analysis. It uses a heated tungsten or lanthanum hexaboride emitter as electron source and configured with secondary and backscattered electron detectors as well as an energy dispersive X-ray spectrometer. These combined capabilities provide basic image, surface morphology, structural and chemical composition information for materials. The instrument is fitted with self-made digital, computer controlled image and commercial spectra acquisition system.